Final Program: Combining Raman and Scanning Probe Microscopy (SPM)

Combining Raman and Scanning Probe Microscopy (SPM) - Are we there yet?

Date: Thursday, September 28, 3:15 pm
Emerging Raman - IRL03

Advances in Vibrational Spectroscopic Spatial Resolution and Measurement Speed Using Raman Microscopy and AFM Tip-Enhaced Raman Spectroscopy (TERS); Andrew Whitley, Horiba Jobin Yvon, Inc.

Raman Microscopy and Raman NSOM: Chemical Imaging on the Nanometer Length Scale; Alan Campion, The University of Texas at Austin

Scanning Nano-Raman Spectroscopy of Silicon and Other Semiconducting Materials; Alexei Sokolov, University of Akron

Tip enhanced Raman spectroscopy - applications for life science; Volker Deckert, ISAS - Institute for Analytical Sciences

Raman/AFM � TERS: Optimizing and understanding measurement conditions to obtain high enhancement and spectral contrast; Razvigor Ossikovski, Ecole Polytechnique

Investigation of Apertureless NSOM for Measurement of Stress in Strained Silicon; Robert Geer, College of Nanoscale Sci & Eng, UAlbany

Title	Presenting Author	Date	Time
Raman Microscopy and Raman NSOM: Chemical Imaging on the Nanometer Length Scale	Alan Campion	Thu Sep 28	3:15 pm
Tip enhanced Raman spectroscopy - applications for life science	Volker Deckert	Thu Sep 28	3:55 pm
Scanning Nano-Raman Spectroscopy of Silicon and Other Semiconducting Materials	Alexei Sokolov	Thu Sep 28	3:55 pm
Tip-enhanced optical spectroscopy of single-walled carbon nanotubes	Neil Anderson	Thu Sep 28	4:15 pm
Raman/AFM - TERS: Understanding and optimizing measurement conditions to \r\nobtain high spectral contrast	Razvigor Ossikovski	Thu Sep 28	4:35 pm
Investigation of Apertureless NSOM for Measurement of Stress in Strained Silicon	Robert Geer	Thu Sep 28	4:55 pm

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